From e756a21636149ad47c19c659d04be93cf3071dab Mon Sep 17 00:00:00 2001 From: Donald Kjer Date: Mon, 23 Aug 2021 15:15:34 -0700 Subject: eeprom_stm32: implement high density wear leveling (#12567) * eeprom_stm32: implement wear leveling Update EECONFIG_MAGIC_NUMBER eeprom_stm32: check emulated eeprom size is large enough * eeprom_stm32: Increasing simulated EEPROM density on stm32 * Adding utility script to decode emulated eeprom * Adding unit tests * Applying qmk cformat changes * cleaned up flash mocking * Fix for stm32eeprom_parser.py checking via signature with wrong base * Fix for nk65 keyboard Co-authored-by: Ilya Zhuravlev Co-authored-by: zvecr --- tmk_core/common/chibios/flash_stm32.h | 7 +++++-- 1 file changed, 5 insertions(+), 2 deletions(-) (limited to 'tmk_core/common/chibios/flash_stm32.h') diff --git a/tmk_core/common/chibios/flash_stm32.h b/tmk_core/common/chibios/flash_stm32.h index 90d5bff47e..9c6a7cc50f 100644 --- a/tmk_core/common/chibios/flash_stm32.h +++ b/tmk_core/common/chibios/flash_stm32.h @@ -22,8 +22,11 @@ extern "C" { #endif -#include -#include +#include + +#ifdef FLASH_STM32_MOCKED +extern uint8_t FlashBuf[MOCK_FLASH_SIZE]; +#endif typedef enum { FLASH_BUSY = 1, FLASH_ERROR_PG, FLASH_ERROR_WRP, FLASH_ERROR_OPT, FLASH_COMPLETE, FLASH_TIMEOUT, FLASH_BAD_ADDRESS } FLASH_Status; -- cgit v1.2.3